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ST10F271 データシート(PDF) 137 Page - STMicroelectronics

部品番号 ST10F271
部品情報  16-bit MCU with 128 Kbyte Flash memory and 12 Kbyte RAM
PDF  173 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
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ST10F271 データシート(HTML) 137 Page - STMicroelectronics

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ST10F271
Electrical characteristics
137/173
equal to the conversion rate of a single channel (maximum when fixed channel continuous
conversion mode is selected), it can be seen as a resistive path to ground. For instance,
assuming a conversion rate of 250kHz, with CS equal to 4pF, a resistance of 1MΩ is
obtained (REQ = 1 / fCCS, where fC represents the conversion rate at the considered
channel). To minimize the error induced by the voltage partitioning between this resistance
(sampled voltage on CS) and the sum of RS + RF + RL + RSW + RAD, the external circuit
must be designed to respect the following relation:
The formula above provides a constraints for external network design, in particular on
resistive path.
A second aspect involving the capacitance network shall be considered. Assuming the three
capacitances CF, CP1 and CP2 initially charged at the source voltage VA (refer to the
equivalent circuit reported in Figure 40), when the sampling phase is started (A/D switch
close), a charge sharing phenomena is installed.
Figure 41.
Charge sharing timing diagram during sampling phase
In particular two different transient periods can be distinguished (see Figure 41):
A first and quick charge transfer from the internal capacitance CP1 and CP2 to the
sampling capacitance CS occurs (CS is supposed initially completely discharged):
considering a worst case (since the time constant in reality would be faster) in which
CP2 is reported in parallel to CP1 (call CP = CP1 + CP2), the two capacitance CP and CS
are in series, and the time constant is:
This relation can again be simplified considering only CS as an additional worst
condition. In reality, the transient is faster, but the A/D Converter circuitry has been
designed to be robust also in the very worst case: the sampling time TS is always much
longer than the internal time constant:
The charge of CP1 and CP2 is redistributed also on CS, determining a new value of the
voltage VA1 on the capacitance according to the following equation:
A second charge transfer involves also CF (that is typically bigger than the on-chip
capacitance) through the resistance RL: again considering the worst case in which CP2
V
A
R
S
R
F
R
L
R
SW
R
AD
++
+
+
R
EQ
------------------------------------------------------------------------------
1
2
---LSB
<
VA
VA1
VA2
t
TS
VCS
Voltage Transient on CS
∆V < 0.5 LSB
1
2
τ
1 < (RSW + RAD) CS << TS
τ
2 = RL (CS + CP1 + CP2)
τ
1
R
SW
R
AD
+
()
=
C
P
C
S
C
P
C
S
+
-----------------------
τ
1
R
SW
R
AD
+
()
<
C
S
T
S
<<
V
A1
C
S
C
P1
C
P2
++
()
V
A
C
P1
C
P2
+
()
=



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