ST72260G datasheet(125/171 Pages) STMICROELECTRONICS

125 / 171 page

ST72260G, ST72262G, ST72264G

125/171

OPERATING CONDITIONS (Cont’d)

13.3.2 Low Voltage Detector (LVD) Thresholds

TA = -40 to +85°C unless otherwise specified

Notes:

1. Data based on characterization results, not tested in production.

2. When VtPOR is faster than 100 µs/V, the Reset signal is released after a delay of max. 42µs after VDD crosses the

VIT+(LVD) threshold.

Figure 65. LVD Startup Behaviour

Note: When the LVD is enabled, the MCU reaches its authorized operating voltage from a reset state.

However, in some devices, the reset state is released when VDD is approximately between 0.8V and 1.5V.

As a consequence, depending on the ramp-up speed, the I/Os may toggle when VDD is within this win-

dow.

This may be an issue especially for applications where the MCU drives power components.

Because Flash write access is impossible within this window, the Flash memory contents will not be cor-

rupted.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VIT+(LVD)

Reset release threshold

(VDD rise)

High Threshold

Med. Threshold

Low Threshold

4.0 1)

3.55 1)

2.95 1)

4.2

3.75

3.15

4.5

4.0

3.35

VIT-(LVD)

Reset generation threshold

(VDD fall)

High Threshold

Med. Threshold

Low Threshold

3.75

3.3

2.75

4.0

3.55

3.0

4.251)

3.751)

3.151)

Vhys(LVD)

LVD voltage threshold hysteresis

VIT+(LVD)-VIT-(LVD)

150

200

250

VtPOR

VDD rise time rate

1)2)

µs/V

100

ms/V

tg(VDD)

Filtered glitch delay on VDD

Not detected by the LVD

1.5V

VIT+

0.8V

LVD RESET

V D

Window

ST72260G データシート(PDF) 125 Page - STMicroelectronics

ST72260G データシート(HTML) 125 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 ...More

データシートダウンロード