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データシートサーチシステム |
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データシートサーチシステム |
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4250 データシート(PDF) 57 Page - Renesas Technology Corp |
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4250 データシート(HTML) 57 Page - Renesas Technology Corp |
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57 / 59 page  56 MITSUBISHI MICROCOMPUTERS 4250 Group SINGLE-CHIP 4-BIT CMOS MICROCOMPUTER Fig. 33 Flow of writing and test of the product shipped in blank Writing with PROM programmer Screening (Leave at 150 °C for 40 hours) (Note) Verify test with PROM programmer Function test in target device Since the screening temperature is higher than storage temperature, never expose the microcomputer to 150°C exceeding 100 hours. Note: (1) PROM mode The 4250 Group has a function to serially input/output the command codes, addresses, and data required for operation (e.g. read and program) on the built-in PROM using only a few pins. This mode can be selected by setting pins SDA (serial data input/output), SCLK (serial clock input), and PGM to “H” after connecting wires as shown in Figure 32 and powering on the VDD pin, and then applying 12 V to the VPP pin. In the PROM mode, three types of software commands (read, program, and program verify) can be used. Clock-synchronous serial I/O is used, beginning from the LSB (LSB first). Use the special-purpose serial programmer when performing serial read/program. Refer to the Mitsubishi Data Book “DEVELOPMENT SUPPORT TOOLS FOR MICROCOMPUTERS” about the serial programmer (serial programmer and control software, etc.) for the Mitsubishi single-chip microcomputers. (2) Notes on handling A high-voltage is used for writing. Take care that overvoltage is not applied. Take care especially at turning on the power. For the One Time PROM version shipped in blank, Mitsubishi Electric corp. does not perform PROM writing test and screening in the assembly process and following processes. In order to improve reliability after writing, performing writing and test according to the flow shown in Figure 33 before using is recommended (Products shipped in blank: PROM contents is not written in factory when shipped) |
同様の部品番号 - 4250 |
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同様の説明 - 4250 |
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