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SN75424N データシート(PDF) 5 Page - Texas Instruments |
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SN75424N データシート(HTML) 5 Page - Texas Instruments |
5 / 7 page ![]() SN75423, SN75424 HIGH-VOLTAGE HIGH-CURRENT DARLINGTON TRANSISTOR ARRAYS SLDS115 – FEBRUARY 1998 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 PARAMETER MEASUREMENT INFORMATION Input Open VS = 50 V RL = 163 Ω Output CL = 15 pF (see Note B) 90% 90% 50% 50% 10% 10% 50% 50% tPHL tPLH 0.5 µs ≤ 10 ns ≤ 5 ns VIH (see Note C) 0 V VOH VOL Input Output TEST CIRCUIT Pulse Generator (see Note A) NOTES: A. The pulse generator has the following characteristics: PRR = 12.5 kHz, ZO = 50 Ω. B. CL includes probe and jig capacitance. C. For testing the SN75423, VIH = 3 V; for the SN75424, VIH = 8 V. Figure 9. Propogation Delay Test Circuit and Voltage Waveforms Input VS 200 Ω Output CL = 15 pF (see Note B) 90% 90% 1.5 V 1.5 V 10% 10% 40 µs ≤ 10 ns ≤ 5 ns VIH (see Note C) 0 V VOH VOL Input Output TEST CIRCUIT 2 mH Pulse Generator (see Note A) NOTES: A. The pulse generator has the following characteristics: PRR = 12.5 kHz, ZO = 50 Ω. B. CL includes probe and jig capacitance. C. For testing the SN75423, VIH = 3 V; for the SN75424, VIH = 8 V. Figure 10. Latch-Up Test Circuit and Voltage Waveforms |
同様の部品番号 - SN75424N |
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同様の説明 - SN75424N |
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