1 Features
• e-trim™ operational amplifier performance
– Low offset voltage: 25 μV (max),
15 μV (max, high grade)
– Low offset voltage drift: ±0.5 μV/°C (max),
±0.2 μV/°C (max, high grade)
• Super beta inputs
– Input bias current: 500 pA (max)
– Input current noise: 110 fA/√Hz
• Low noise
– 0.1 to 10-Hz: 0.2 μVPP
– Voltage noise: 7.2 nV/√Hz
• AOL, CMRR, and PSRR: > 126 dB (full
temperature range)
• Gain bandwidth product: 3.6 MHz
• Low quiescent current: 240 μA (max)
• Slew rate: 4 V/μs
• Overload power limiter
• Rail-to-rail output
• EMI and RFI filtered inputs
• Wide supply: 4.5 V to 36 V
• Temperature range: –40°C to +125°C
• Available in standard grade (OPAx205A) and
high grade (OPA2205, preview)
• Available with ±40-V overvoltage protection in the
OPA206 and OPA2206

2 Applications
• Flow transmitter
• String inverter
• Data acquisition (DAQ)
• Source measurement unit (SMU)
• Lab and field instrumentation
• Battery test
• Analog input module
• Pressure transmitter

3 Description
The OPA205, OPA2205, and OPA4205 (OPAx205)
are the next generation of the industry-standard
OPAx277 family. The OPA206 and OPA2206 are
related devices with the same op-amp core, but with
the added feature of input overvoltage protection
±40 V above the supplies. These devices are
precision, bipolar e-trim™ op amps with super-beta
inputs. TI's proprietary trimming technology is used to
achieve a typical input offset voltage of ±4 μV (±2 μV,
high grade), and a typical input offset voltage drift of
±0.08 μV (±0.04 μV, high grade).
Designed on a bipolar process, the OPAx205 provide
3.6‑MHz gain bandwidth for a mere 220 μA of
quiescent current. The devices also achieve a low
voltage noise density of only 7.2 nV/√Hz at 1 kHz.
The super-beta inputs of the OPAx205 have a very
low input bias current of 100 pA (typical) and a current
noise density of 110 fA/√Hz.
The high performance of the OPAx205 makes these
devices an excellent choice for systems requiring
high precision and low power consumption, such
as flow and pressure transmitters, portable data
acquisition (DAQ) systems, and high-density source
measurement units (SMU).