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7525 データシート (PDF) - Toshiba Semiconductor

7525 Datasheet PDF - Toshiba Semiconductor
部品番号 7525
ダウンロード  7525 ダウンロード
ファイルサイズ   204.12 Kbytes
ページ   14 Pages
メーカー  TOSHIBA [Toshiba Semiconductor]
ホームページ  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor
部品情報 X-ray Thickness Gage

7525 Datasheet (PDF)

Go To PDF Page ダウンロード データシート
7525 Datasheet PDF - Toshiba Semiconductor

部品番号 7525
ダウンロード  7525 Click to download

ファイルサイズ   204.12 Kbytes
ページ   14 Pages
メーカー  TOSHIBA [Toshiba Semiconductor]
ホームページ  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor
部品情報 X-ray Thickness Gage

7525 データシート (HTML) - Toshiba Semiconductor


7525 製品詳細

General

The X-ray thickness gage is used to measure the thickness of a strip continuously without contacting that strip. This gage uses the fact that the amount of radiation that passes through the strip varies with the thickness of that strip.

The TOSGAGE-7525 is a high quality thickness gage for cold rolling achieving outstanding safety, operability, accuracy and cost-performance developed over many years. It has the following features.



• Noise immunity is improved by digitizing the signals between the measuring head and the equipment cabinet.

• The operation-PC uses Windows® NT, and is a user-friendly PC.

• A newly-developed X-ray generator is used, providing extremely accurate measurement results with a quick response time. The TOSGAGE-7525 focuses X-ray beams finely in the strip width direction to improve thickness resolution in the strip width direction, and making it suited to measuring the shape of the section of measured materials.



 




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