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LM12434CIWM データシート(PDF) 22 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部品番号 LM12434CIWM
部品情報  Sign Data Acquisition System with Serial I/O and Self-Calibration
PDF  80 Pages
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メーカー  NSC [National Semiconductor (TI)]
ホームページ  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM12434CIWM データシート(HTML) 22 Page - National Semiconductor (TI)

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40 Typical Performance Characteristics (Continued)
The following curves apply for 12-bit a sign mode after auto-calibration unless otherwise specified
RS e 50X TA e 25 C VAa e VDa e 5V VREF e 4096V fCLK e 8 MHz fSCLK e 10 MHz VIN e g4096V
x0 dB
Sampling Rate e 1333 kHz
vs Input Frequency
Bipolar Signal-to-Noise Ratio
Input Frequency
a
Distortion vs
Bipolar Signal-to-Noise
Distortion vs Input Frequency
Bipolar Total Harmonic
vs Input Frequency
Dynamic Range
Bipolar Spurious Free
Sine Wave at 0 dB
with 1025 kHz
Bipolar Spectral Response
Sine Wave at 0 dB
with 10010 kHz
Bipolar Spectral Response
Sine Wave at 0 dB
with 40283 kHz
Bipolar Spectral Response
Sine Wave at b05 dB
with 40283 kHz
Bipolar Spectral Response
Sine Wave at b10 dB
with 40283 kHz
Bipolar Spectral Response
with 6225 kHz
Bipolar Spectral Response
Sine Wave at 0 dB
TLH11879 – 25
Bipolar Two Tone Spectral
Response with f1 e 19190 kHz and
f2 e 19482 kHz Sine Waves
TLH11879 – 26
22



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