NCV47722

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4

Table 2. MAXIMUM RATINGS

Rating

Symbol

Min

Max

Unit

Input Voltage DC

−42

45

V

Input Voltage (Note 1)

Load Dump − Suppressed

−

60

V

Enable Input Voltage

−42

45

V

Output Voltage Monitoring

−0.3

10

V

CSO Voltage

−0.3

7

V

DE, CS and EF Voltages

−0.3

7

V

Output Voltage

−1

40

V

Junction Temperature

−40

150

°C

Storage Temperature

−55

150

°C

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. Load Dump Test B (with centralized load dump suppression) according to ISO16750−2 standard. Guaranteed by design. Not tested in

production. Passed Class A according to ISO16750−1.

Rating

Symbol

Min

Max

Unit

ESD Capability, Human Body Model

−2

2

kV

2. This device series incorporates ESD protection and is tested by the following methods:

ESD Human Body Model tested per AEC−Q100−002 (JS−001−2010)

to the inability of a small package body to acquire and retain enough charge to meet the minimum CDM discharge current waveform

characteristic defined in JEDEC JS−002−2014.

Rating

Symbol

Min

Max

Unit

Moisture Sensitivity Level

MSL

1

−

3. For more information, please refer to our Soldering and Mounting Techniques Reference Manual, SOLDERRM/D

Rating

Symbol

Value

Unit

Thermal Characteristics (single layer PCB)

Thermal Resistance, Junction−to−Air (Note 5)

Thermal Reference, Junction−to−Lead (Note 5)

62.6

23.7

°C/W

Thermal Characteristics (4 layers PCB)

Thermal Resistance, Junction−to−Air (Note 5)

Thermal Reference, Junction−to−Lead (Note 5)

44.1

16.8

°C/W

4. Refer to ELECTRICAL CHARACTERISTICS and APPLICATION INFORMATION for Safe Operating Area.

4 layers − according to JEDEC51.7

Table 5. RECOMMENDED OPERATING RANGES

Rating

Symbol

Min

Max

Unit

Input Voltage (Note 6)

4.4

40

V

Output Current Limit (Note 7)

10

350

mA

Junction Temperature

−40

150

°C

Current Sense Output (CSO) Capacitor

1

4.7

mF

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond

the Recommended Operating Ranges limits may affect device reliability.