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TDA7411 データシート(PDF) 29 Page - STMicroelectronics |
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TDA7411 データシート(HTML) 29 Page - STMicroelectronics |
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29 / 43 page ![]() 29/43 TDA7411 Figure 24. Mute Control Logic Test Mode During the test mode which can be activated by setting bit D0 of the testing-byte and bit D5 of the sub address byte to "1" several internal signals are available at the CDR pin. During this mode the input re- sistance of 100kOhm is disconnected from the pin. The internal signals available are shown in the data byte specification. |
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