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BCR5PM データシート(PDF) 2 Page - Mitsubishi Electric Semiconductor |
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BCR5PM データシート(HTML) 2 Page - Mitsubishi Electric Semiconductor |
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2 / 5 page ![]() Feb.1999 100 23 5 7 101 40 20 23 5 7 102 44 60 80 100 30 10 50 70 90 0 4.6 0.6 1.4 2.2 3.0 3.8 1.0 1.8 2.6 3.4 4.2 102 7 5 3 2 101 7 5 3 2 100 7 5 3 2 10–1 Tj = 125°C Tj = 25°C MAXIMUM ON-STATE CHARACTERISTICS ON-STATE VOLTAGE (V) RATED SURGE ON-STATE CURRENT CONDUCTION TIME (CYCLES AT 60Hz) MITSUBISHI SEMICONDUCTOR 〈TRIAC〉 BCR5PM MEDIUM POWER USE INSULATED TYPE, PLANAR PASSIVATION TYPE V2. Measurement using the gate trigger characteristics measurement circuit. V3. The critical-rate of rise of the off-state commutating voltage is shown in the table below. V4. The contact thermal resistance Rth (c-f) in case of greasing is 0.5 °C/W. V5. High sensitivity (IGT ≤10mA) is also available. (IGT item 1) Test conditions Voltage class 8 12 VDRM (V) 400 600 Min. — 5 — 5 Commutating voltage and current waveforms (inductive load) (dv/dt) c Symbol R L R L Unit V/ µs 1. Junction temperature Tj=125 °C 2. Rate of decay of on-state commutat- ing current (di/dt)c=–2.5A/ms 3. Peak off-state voltage VD=400V Symbol IDRM VTM VFGT ! VRGT ! VRGT # IFGT ! IRGT ! IRGT # VGD Rth (j-c) (dv/dt)c Parameter Repetitive peak off-state current On-state voltage Gate trigger voltage V2 Gate trigger current V2 Gate non-trigger voltage Thermal resistance Critical-rate of rise of off-state commutating voltage Test conditions Tj=125 °C, VDRM applied Tc=25 °C, ITM=7A, Instantaneous measurement Tj=25 °C, VD=6V, RL=6Ω, RG=330Ω Tj=25 °C, VD=6V, RL=6Ω, RG=330Ω Tj=125 °C, VD=1/2VDRM Junction to case V4 Unit mA V V V V mA mA mA V °C/W V/ µs Typ. — — — — — — — — — — — ! @ # ! @ # ELECTRICAL CHARACTERISTICS Limits Min. — — — — — — — — 0.2 — V3 Max. 2.0 1.8 1.5 1.5 1.5 20 V5 20 V5 20 V5 — 4.0 — SUPPLY VOLTAGE TIME TIME TIME MAIN CURRENT MAIN VOLTAGE (di/dt)c VD (dv/dt)c PERFORMANCE CURVES |
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