DA6512.003

2 December, 2016

6 (32)

ELECTRICAL CHARACTERISTICS

Parameter

Symbol

Conditions

Min

Typ

Max

Unit

RMS capacitance

resolution @

Difference mode, note 1

TEMPREGEN=0,

OSR=2048

OSR=1024

OSR=512

OSR=256

16.8 (19)

16.5 (25)

15.8 (39)

15.4 (53)

bit (aF)

RMS capacitance

resolution @

Difference mode, note 1

TEMPREGEN=0,

OSR=2048

OSR=1024

OSR=512

OSR=256

16.9 (42)

16.1 (69)

15.7 (92)

15.1 (138)

bit (aF)

RMS capacitance

resolution @

Difference mode, note 1

TEMPREGEN=0,

OSR=2048

OSR=1024

OSR=512

OSR=256

16.2 (337)

15.9 (417)

15.5 (546)

14.6 (1010)

bit (aF)

RMS capacitance

resolution @

Ratio mode, note 1

TEMPREGEN=0,

OSR=2048

OSR=1024

OSR=512

OSR=256

14.1 (133)

13.5 (196)

13.0 (276)

12.6 (364)

bit (aF)

RMS capacitance

resolution@

CLIN=4pF

Ratio mode, note 1

TEMPREGEN=0,

CLIN=4pF

OSR=2048

OSR=1024

OSR=512

OSR=256

14.7 (193)

14.4 (227)

14.0 (296)

13.3 (495)

bit (aF)

RMS capacitance

resolution @

CLIN=20pF

Ratio mode, note 1

TEMPREGEN=0,

CLIN=20pF

OSR=2048

OSR=1024

OSR=512

OSR=256

15.7 (468)

15.6 (513)

15.2 (673)

14.6 (1004)

bit (aF)

EEPROM size

256

bit

EEPROM data

retention

Note 2

10

24

1

years

full scale changing capacitance (

respectively. Note also that when calculating resolution in bits by ratio of full scale signal range and RMS noise the result can exceed the

number of bits in the ADC. In contrast when using peak to peak signal range and noise values for bit resolution calculation the maximum

possible value is the same as number of bits in the ADC.

Note 2. Data retention values apply when extended EEPROM tests are done. Please contact Micro Analog Systems Oy if the data retention

values here need to be guaranteed by comprehensive EEPROM testing.