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CAT24FC32A データシート(PDF) 2 Page - Catalyst Semiconductor

部品番号 CAT24FC32A
部品情報  32K-Bit Fast Mode I2C Serial CMOS EEPROM
PDF  12 Pages
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メーカー  CATALYST [Catalyst Semiconductor]
ホームページ  http://www.catalyst-semiconductor.com
Logo CATALYST - Catalyst Semiconductor

CAT24FC32A データシート(HTML) 2 Page - Catalyst Semiconductor

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CAT24FC32A
2
Doc. No. 1048, Rev. F
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is VCC +0.5V, which may overshoot to VCC + 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V.
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55
°C to +125°C
Storage Temperature ....................... –65
°C to +150°C
Voltage on Any Pin with
Respect to Ground(1) ........... –2.0V to +VCC + 2.0V
VCC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (TA = 25
°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300
°C
Output Short Circuit Current(2) ........................ 100mA
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
PIN FUNCTIONS
Pin Name
Function
A0, A1, A2
Device Address Inputs
SDA
Serial Data/Address
SCL
Serial Clock
WP
Write Protect
VCC
Power Supply
VSS
Ground
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Min.
Max.
Units
Reference Test Method
NEND(3)
Endurance
1,000,000
Cycles/Byte
MIL-STD-883, Test Method 1033
TDR(3)
Data Retention
100
Years
MIL-STD-883, Test Method 1008
VZAP(3)
ESD Susceptibility
2000
Volts
MIL-STD-883, Test Method 3015
ILTH(3)(4)
Latch-up
100
mA
JEDEC Standard 17
RECOMMENDED OPERATING CONDITIONS
Temperature Range
Minimum
Maximum
Commercial
0˚C
+70˚C
Supply Voltage Range
Device
1.8V to 3.6V
CAT24FC32A



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