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ADRF5047BCCZN-R7 データシート(PDF) 14 Page - Analog Devices |
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ADRF5047BCCZN-R7 データシート(HTML) 14 Page - Analog Devices |
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14 / 15 page ![]() ADRF5047 Data Sheet Rev. 0 | Page 14 of 15 PROBE MATRIX BOARD The probe matrix board uses same stackup as the evaluation board but a different layout designed to take measurements using ground, signal, ground (GSG) probes at close proximity to the RFx pins. Probing eliminates the mismatch reflections caused by connectors, cables, and board layout. Therefore, the probe matrix board provides more accurate measurement of the device performance than the evaluation board. Figure 29 shows the top view of the probe matrix board layout. The probe matrix board includes a through reflect line (TRL) calibration kit allowing board loss de-embedding. The actual board duplicates the same layout in matrix form to assemble multiple devices at one time. All s parameters were measured on this board. Figure 29. Probe Matrix Board Layout (Top View) |
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