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ADRF5044BCCZN-R7 データシート(PDF) 13 Page - Analog Devices

部品番号 ADRF5044BCCZN-R7
部品情報  100 MHz to 30 GHz, Silicon, SP4T Switch
PDF  14 Pages
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メーカー  AD [Analog Devices]
ホームページ  http://www.analog.com
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ADRF5044BCCZN-R7 データシート(HTML) 13 Page - Analog Devices

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Data Sheet
ADRF5044
Rev. A | Page 13 of 14
PROBE MATRIX BOARD
The probe matrix board is a 4-layer board that uses a 12 mil
Rogers RO4003 as the top dielectric material. The external
copper layer is 0.7 mil, and the internal copper layers are
1.4 mil. The RF transmission lines were designed using a
CPWG model, with a 16 mil width and a ground spacing of
6 mil, to have a characteristic impedance of 50 Ω.
Figure 26 shows the cross sectional view of the probe matrix
board, and Figure 27 shows the top view of the probe matrix
board. Measurements were made using 535 μm GSG probes at
close proximity to the RFx pins. Unlike the ADRF5044-EVALZ,
probing reduces reflections caused by mismatch arising from
connectors, cables, and board layout, resulting in a more
accurate measurement of the performance of the ADRF5044.
RO4003
1oz Cu (1.4mil)
1oz Cu (1.4mil)
0.5oz Cu (0.7mil)
0.5oz Cu (0.7mil)
0.5oz Cu (0.7mil)
0.5oz Cu (0.7mil)
FR4
FR4
W = 16mil
G = 6mil
T = 0.7mil
H = 12mil
Figure 26. Probe Matrix Board (Cross Sectional View)
Figure 27. Probe Board Layout (Top View)
RF traces for a through reflect line (TRL) calibration are
designed on the board itself. A nonzero line length
compensates for board loss at calibration. The actual board
duplicates the same layout in matrix form to assemble multiple
devices at once. Insertion loss and input and output return
losses were measured on this probe matrix board. Isolation
performance measured on the probe matrix board is limited
due to signal coupling between the RF probes that are in close
proximity. Therefore, RF port to port isolation was measured
on the ADRF5044-EVALZ.



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