V. Quality Assurance Information

A. Quality Assurance Contacts:

Ken Wendel (Director, Reliability Engineering)

Bryan Preeshl (Managing Director of QA)

B. Outgoing Inspection Level:

0.1% for all electrical parameters guaranteed by the Datasheet.

0.1% For all Visual Defects.

C. Observed Outgoing Defect Rate:

< 50 ppm

D. Sampling Plan:

Mil-Std-105D

VI. Reliability Evaluation

A. Accelerated Life Test

MAX17428GTJ+

The results of the 135°C biased (static) life test are pending. Using these results, the Failure Rate ( ) is calculated as follows:

=

1

=

1.83

(Chi square value for MTTF upper limit)

MTTF

192 x 4340 x 96 x 2

(where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV)

= 11.2 x 10

-9

= 11.2 F.I.T. (60% confidence level @ 25°C)

The following failure rate represents data collected from Maxim’s reliability monitor program. Maxim performs quarterly

1000 hour life test monitors on its processes. This data is published in the Product Reliability Report found at http://www.maxim-

B. Moisture Resistance Tests

The industry standard 85°C/85%RH or HAST testing is monitored per device process once a quarter.

C. E.S.D. and Latch-Up Testing

The PE11-2 die type has been found to have all pins able to withstand a HBM transient pulse of +/-1000V per

JEDEC JESD22-A114. Latch-Up testing has shown that this device withstands a current of +/-250mA, 1.5x VCCMax

Overvoltage per JESD78.

Maxim Integrated Products. All rights reserved.

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