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STM32F303X6 データシート(PDF) 21 Page - STMicroelectronics

部品番号 STM32F303X6
部品情報  Arm® Cortex®-M4 32b MCUFPU, up to 64KB Flash, 16KB SRAM, 2 ADCs, 3 DACs, 3 comp., op-amp 2.0 - 3.6 V
PDF  124 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F303X6 データシート(HTML) 21 Page - STMicroelectronics

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DS9866 Rev 8
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STM32F303x6/x8
Functional overview
45
independently. A pending register maintains the status of the interrupt requests. The EXTI
can detect an external line with a pulse width shorter than the internal clock period. Up to 51
GPIOs can be connected to the 16 external interrupt lines.
3.10
Fast analog-to-digital converter (ADC)
Two 5 MSPS fast analog-to-digital converters, with selectable resolution between 12 and 6
bit, are embedded in the STM32F303x6/8 family devices. The ADCs have up to 21 external
channels. Some of the external channels are shared between ADC1 and ADC2, performing
conversions in single-shot or scan modes. The channels can be configured to be either
single-ended input or differential input. In scan mode, automatic conversion is performed on
a selected group of analog inputs.
The ADCs also have internal channels: temperature sensor connected to ADC1 channel 16,
VBAT/2 connected to ADC1 channel 17, voltage reference VREFINT connected to both ADC1
and ADC2 channel 18 and VOPAMP2 connected to ADC2 channel 17.
Additional logic functions embedded in the ADC interface allow:
Simultaneous sample and hold
Interleaved sample and hold
Single-shunt phase current reading techniques.
Three analog watchdogs are available per ADC. The ADC can be served by the DMA
controller.
The analog watchdog feature allows very precise monitoring of the converted voltage of
one, some or all selected channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the general-purpose timers (TIM2, TIM3, TIM6, TIM15) and the
advanced-control timer (TIM1) can be internally connected to the ADC start trigger and
injection trigger, respectively, to allow the application to synchronize A/D conversion and
timers.
3.10.1
Temperature sensor
The temperature sensor (TS) generates a voltage VSENSE that varies linearly with
temperature.
The temperature sensor is internally connected to the ADC1_IN16 input channel that is
used to convert the sensor output voltage into a digital value.
The sensor provides good linearity but it has to be calibrated to obtain good overall
accuracy of the temperature measurement. As the offset of the temperature sensor varies
from chip to chip due to process variation, the uncalibrated internal temperature sensor is
suitable for applications that detect temperature changes only.
To improve the accuracy of the temperature sensor measurement, each device is
individually factory-calibrated by ST. The temperature sensor factory calibration data are
stored by ST in the system memory area, accessible in read-only mode.
3.10.2
Internal voltage reference (VREFINT)
The internal voltage reference (VREFINT) provides a stable (bandgap) voltage output for the
ADC and Comparators. VREFINT is internally connected to the ADC1_IN18 and ADC2_IN18



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