1. The VOH and VOL tests shall be tested at VCC = 3.0 V and 4.5 V. The VOH and VOL tests are guaranteed, if not tested,

for other values of VCC. Limits shown apply to operation at VCC = 3.3 V ±0.3 V and VCC = 5.0 V ±0.5 V. Tests with input

current at +50 mA and –50 mA are performed on only one input at a time with duration not to exceed 10 ms. Transmission

driving tests may be performed using VIN = VCC or GND. When VIN = VCC or GND is used, the test is guaranteed for VIN

= VIH minimum and VIL maximum.

2. CIN and CPD shall be measured only for initial qualification and after process or design changes which may affect

capacitance. CIN shall be measured between the designated terminal and GND at a frequency of 1 MHz. CPD shall be

tested in accordance with the latest revision of JEDEC standard JESD20 and table IA herein. For CIN and CPD, test all

applicable pins on five devices with zero failures.

3. Power dissipation capacitance (CPD) determines both the power consumption (PD) and dynamic current consumption (IS).

Where: PD = (CPD + CL) (VCC x VCC) f + (ICC x VCC) and IS = (CPD + CL) VCC x f + ICC, and f is the frequency of the

input signal and CL is the external output load capacitance.

4. The AC limits at VCC = 5.5 V are equal to the limits at VCC = 4.5 V and guaranteed by testing at VCC = 4.5 V. The AC

limits at VCC = 3.6 V are equal to the limits at VCC = 3.0 V and guaranteed by testing at VCC = 3.0 V. Minimum AC limits

for VCC= 5.5 V and VCC = 3.6 V are 1.0 ns and guaranteed by guard banding the VCC = 4.5 V and VCC = 3.0 V minimum

limits, respectively, to 1.5 ns. For propagation delay tests, all paths must be tested.

LEOAC244

Electrical characteristics

DS13637 - Rev 4

page 6/18