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STF8N60DM2 データシート(PDF) 5 Page - STMicroelectronics |
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STF8N60DM2 データシート(HTML) 5 Page - STMicroelectronics |
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5 / 13 page ![]() STF8N60DM2 Electrical characteristics DocID027864 Rev 2 5/13 Table 8: Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 8 A ISDM(1) Source-drain current (pulsed) - 32 A VSD(2) Forward on voltage VGS = 0 V, ISD = 8 A - 1.6 V trr Reverse recovery time ISD = 8 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 16: "Test circuit for inductive load switching and diode recovery times") - 80 ns Qrr Reverse recovery charge - 188 nC IRRM Reverse recovery current - 4.7 A trr Reverse recovery time ISD = 8 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see Figure 16: "Test circuit for inductive load switching and diode recovery times") - 160 ns Qrr Reverse recovery charge - 640 nC IRRM Reverse recovery current - 8 A Notes: (1) Pulse width is limited by safe operating area. (2) Pulse test: pulse duration = 300 µs, duty cycle 1.5%. |
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