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165RHT データシート(PDF) 10 Page - NXP Semiconductors |
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165RHT データシート(HTML) 10 Page - NXP Semiconductors |
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10 / 10 page ![]() 1998 Jan 29 303 Philips Components Maintenance type Aluminium electrolytic capacitors Radial High Temperature 165 RHT R Table 3 Multiplier of ripple current (IR/IRO) as a function of frequency; IRO = ripple current at 100 Hz; see Fig.9 SPECIFIC TESTS AND REQUIREMENTS General tests and requirements are specified in this handbook, Section “Tests and Requirements”. Table 4 Test procedures and requirements FREQUENCY (Hz) IR MULTIPLIER UR =10to25V UR =35or40V UR =50V 50 0.85 0.80 0.75 100 1.00 1.00 1.00 300 1.20 1.25 1.30 1000 1.30 1.40 1.50 3000 1.35 1.50 1.65 ≥10000 1.40 1.60 1.80 TEST PROCEDURE (quick reference) REQUIREMENTS NAME OF TEST REFERENCE Endurance IEC 384-4/ CECC 30300 subclause 4.13 Tamb = 125 °C; UR applied; 1000 hours ∆C/C: ±15% tan δ≤ 1.3 × spec. limit Z ≤ 2 × spec. limit IL5 ≤ spec. limit Useful life CECC 30301 subclause 1.8.1 Tamb = 125 °C; UR and IR applied; 1500 hours ∆C/C: ±45% tan δ≤ 3 × spec. limit Z ≤ 3 × spec. limit IL5 ≤ spec. limit no short or open circuit total failure percentage: ≤1% Shelf life IEC 384-4/ CECC 30300 subclause 4.17 Tamb = 125 °C; no voltage applied; 500 hours after test: UR to be applied for 30 minutes, 24 to 48 hours before measurement ∆C/C: ±15% tan δ≤ 1.3 × spec. limit Z ≤ 2 × spec. limit IL5 ≤ 2 × spec. limit |
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