HCS160MS

FN2296 Rev 2.00

Page 6 of 9

September 1995

Group B

Subgroup B-5

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample/5005

1, 7, 9

Group D

Sample/6005

1, 7, 9

NOTE:

1. Alternate Group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 7, 9

Table 4 (Note 1)

NOTE:

1. Except FN test which will be performed 100% go/no-go.

TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS

OPEN

GROUND

1/2 VCC = 3V

 0.5V

VCC = 6V

 0.5V

OSCILLATOR

50kHz

25kHz

STATIC I BURN-IN

11 - 15

1 - 10

-

16

-

-

STATIC II BURN-IN

11 - 15

8

-

1 - 7, 9, 10, 16

-

-

DYNAMIC BURN-IN

-

4, 6, 8

11 - 15

1, 3, 5, 7, 9, 10, 16

2

-

NOTES:

1. Each pin except VCC and GND will have a resistor of 10K

  5% for static burn-in

2. Each pin except VCC and GND will have a resistor of 1K

  5% for dynamic burn-in

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V

 0.5V

11 - 15

8

1 - 7, 9, 10, 16

NOTE: Each pin except VCC and GND will have a resistor of 47K

  5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUPS

METHOD

GROUP A SUBGROUPS

READ AND RECORD