DSP56367P datasheet(23/100 Pages) FREESCALE

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JTAG/OnCE Interface

DSP56367 Technical Data, Rev. 2.1

Freescale Semiconductor

2-19

2.16

JTAG/OnCE Interface

Table 2-15 JTAG/OnCE Interface

Signal

Name

Signal Type

State during

Reset

Signal Description

TCK

Input

Test Clock—TCK is a test clock input signal used to synchronize the JTAG test

logic. It has an internal pull-up resistor.

This input is 3.3V tolerant.

TDI

Input

Test Data Input—TDI is a test data serial input signal used for test instructions

and data. TDI is sampled on the rising edge of TCK and has an internal pull-up

resistor.

This input is 3.3V tolerant.

TDO

Output

Tri-Stated

Test Data Output—TDO is a test data serial output signal used for test

instructions and data. TDO is tri-statable and is actively driven in the shift-IR

and shift-DR controller states. TDO changes on the falling edge of TCK.

TMS

Input

Test Mode Select—TMS is an input signal used to sequence the test

controller’s state machine. TMS is sampled on the rising edge of TCK and has

an internal pull-up resistor.

This input is 3.3V tolerant.

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