PCK2002MPW datasheet(4/12 Pages) PHILIPS

4 / 12 page

Philips Semiconductors

Product data

PCK2002M

0–300 MHz I2C 1:10 clock buffer

2001 Jul 19

DC CHARACTERISTICS

TEST CONDITIONS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

Tamb = 0 to +70 °C

UNIT

VDD (V)

OTHER

MIN

MAX

VIH

HIGH level input voltage

3.135 to 3.465

2.0

VDD + 0.3

VIL

LOW level input voltage

3.135 to 3.465

VSS – 0.3

0.8

3 3 V output HIGH voltage

3.135 to 3.465

IOH = –1 mA

VCC – 0.1

—

VOH

3.3 V output HIGH voltage

3.135

IOH = –36 mA

2.4

—

3 3 V output LOW voltage

3.135 to 3.465

IOL= 1 mA

—

0.1

VOL

3.3 V output LOW voltage

3.135

IOL= 24 mA

—

0.4

Output HIGH current

3.135 to 3.465

VOUT = 2.0 V

–54

–126

IOH

Output HIGH current

3.135 to 3.465

VOUT = 3.135 V

–21

–46

Output LOW current

3.135 to 3.465

VOUT = 1.0 V

118

IOL

Output LOW current

3.135 to 3.465

VOUT = 0.4 V

±II

Input leakage current

3.465

—

±5

µA

±IOZ

3-State output OFF-State

current

3.465

VOUT = VDD or GND

IO = 0

—

±10

µA

ICC

Quiescent supply current

3.465

VI = VDD or GND

IO = 0

—

100

µA

∆ICC

Additional quiescent supply

current given per control pin

3.135 to 3.465

VI = VDD– 0.6 V

IO = 0

—

500

µA

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