AD5522JSVD datasheet(16/48 Pages) AD

16 / 48 page

AD5522

Preliminary Technical Data

Rev. PrM | Page 16 of 48

TERMINOLOGY

Offset Error

Offset error is a measure of the difference between actual and

ideal voltage expressed in mV.

Gain Error

Gain error is the difference between full-scale error

and zero-scale error. It is expressed in %.

Gain Error = Full-Scale Error − Zero-Scale Error

Linearity Error

Relative accuracy, or endpoint linearity, is a measure of the

maximum deviation from a straight line passing through the

endpoints of the full-scale range. It is measured after adjusting

for offset error and gain error and is expressed in % FSR.

CM Error

Common Mode Error is the error at the output of the amplifier

due to the common mode input voltage. It is expressed in % of

FSR/V.

Clamp Accuracy

Clamp accuracy is a measure of where the clamps begin to

function fully and limit the clamped voltage or current.

Leakage Current

Current measured at an output pin, when that function is off or

high impedance.

Pin Capacitance

Capacitance measured at a pin when that function is off or high

impedance.

Slew Rate

The rate of change of output voltage, expressed in V/μs.

DAC SPECIFIC TERMS

Differential Nonlinearity

Differential nonlinearity is the difference between the measured

change and the ideal 1 LSB change between any two adjacent

codes. A specified differential nonlinearity of ±1LSB maximum

ensures monotonicity.

Output Voltage Settling Time

The amount of time it takes for the output of a DAC to settle to

a specified level for a full-scale input change.

Digital-to-Analog Glitch Energy

The amount of energy injected into the analog output at the

major code transition. The area of the glitch in is specified in

nV-s. It is measured by toggling the DAC register data between

0x1FFF and 0x2000.

Digital Crosstalk

The glitch impulse transferred to the output of one converter

due to a change in the DAC register code of another converter

is defined as the digital crosstalk and is specified in nV-s.

Digital Feedthrough

When the device is not selected, high frequency logic activity

on the device’s digital inputs can be capacitively coupled both

across and through the device to show up as noise on the

VOUT pins. It can also be coupled along the supply and

ground lines. This noise is digital feedthrough.

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