Note 1: Yellow squares indicate typical operating conditions.

Note 2: Median expected lifetime in dependence of junction temperature at 0.35 A/mm2 in continuous operation. Lifetime defined as time to 70% of

initial intensity. Based on lifetime test data of uncoated GaN devices at this time. Data can be used to model failure rate over typical product

lifetime (contact Luminus for lifetime reliability test data for 1 A/mm2 condition).

Note 3: Lumen maintenance in dependence of time at 0.35 A/mm2 in continuous operation with junction temperatures of 100°C. Lumen

maintenance calculation doesn’t consider open and short circuit failure modes into account.

Note 4: Typical spectrum at current density of 0.35 A/mm2 in continuous operation.

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PDS-001540 Rev 17

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SBT-90-W Optical Characteristics

SBT-90-R/W Product Datasheet