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MSC7119 データシート(PDF) 19 Page - Freescale Semiconductor, Inc |
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MSC7119 データシート(HTML) 19 Page - Freescale Semiconductor, Inc |
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19 / 56 page ![]() Electrical Characteristics MSC7119 10/100 Mbps Ethernet MAC Data Sheet, Rev. 6 Freescale Semiconductor 19 2.3 Thermal Characteristics Table 4 describes thermal characteristics of the MSC7119 for the MAP-BGA package. Section 3.1, Thermal Design Considerations explains these characteristics in detail. 2.4 DC Electrical Characteristics This section describes the DC electrical characteristics for the MSC7119. Note: The leakage current is measured for nominal voltage values must vary in the same direction (for example, both VDDIO and VDDC vary by +2 percent or both vary by –2 percent). Table 4. Thermal Characteristics for MAP-BGA Package Characteristic Symbol MAP-BGA 17 × 17 mm5 Unit Natural Convection 200 ft/min (1 m/s) airflow Junction-to-ambient1, 2 RθJA 39 31 °C/W Junction-to-ambient, four-layer board1, 3 RθJA 23 20 °C/W Junction-to-board4 RθJB 12 °C/W Junction-to-case5 RθJC 7 °C/W Junction-to-package-top6 ΨJT 2 °C/W Notes: 1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. 2. Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal. 3. Per JEDEC JESD51-6 with the board horizontal. 4. Thermal resistance between the die and the printed circuit board per JEDEC JESD 51-8. Board temperature is measured on the top surface of the board near the package. 5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). 6. Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. Table 5. DC Electrical Characteristics Characteristic Symbol Min Typical Max Unit Core and PLL voltage VDDC VDDPLL 1.14 1.2 1.26 V DRAM interface I/O voltage1 VDDM 2.375 2.5 2.625 V I/O voltage VDDIO 3.135 3.3 3.465 V DRAM interface I/O reference voltage2 VREF 0.49 × VDDM 1.25 0.51 × VDDM V DRAM interface I/O termination voltage3 VTT VREF – 0.04 VREF VREF + 0.04 V Input high CLKIN voltage VIHCLK 2.4 3.0 3.465 V DRAM interface input high I/O voltage VIHM VREF + 0.28 VDDM VDDM + 0.3 V DRAM interface input low I/O voltage VILM –0.3 GND VREF – 0.18 V Input leakage current, VIN = VDDIO IIN –1.0 0.09 1 µA VREF input leakage current IVREF —— 5 µA |
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