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LM35A データシート(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部品番号 LM35A
部品情報  Precision Centigrade Temperature Sensors
PDF  12 Pages
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メーカー  NSC [National Semiconductor (TI)]
ホームページ  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM35A データシート(HTML) 3 Page - National Semiconductor (TI)

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Electrical Characteristics (Note 1) (Note 6) (Continued)
LM35
LM35C LM35D
Parameter
Conditions
Tested
Design
Tested
Design
Units
Typical
Limit
Limit
Typical
Limit
Limit
(Max)
(Note 4)
(Note 5)
(Note 4)
(Note 5)
Accuracy
TAea25 C
g
04
g
10
g
04
g
10
C
LM35 LM35C
TAeb10 C
g
05
g
05
g
15
C
(Note 7)
TAeTMAX
g
08
g
15
g
08
g
15
C
TAeTMIN
g
08
g
15
g
08
g
20
C
Accuracy
TAea25 C
g
06
g
15
C
LM35D
TAeTMAX
g
09
g
20
C
(Note 7)
TAeTMIN
g
09
g
20
C
Nonlinearity
TMINsTAsTMAX
g
03
g
05
g
02
g
05
C
(Note 8)
Sensor Gain
TMINsTAsTMAX
a
100
a
98
a
100
a
98
mV C
(Average Slope)
a
102
a
102
Load Regulation
TAea25 C
g
04
g
20
g
04
g
20
mVmA
(Note 3) 0sILs1mA
TMINsTAsTMAX
g
05
g
50
g
05
g
50
mVmA
Line Regulation
TAea25 C
g
001
g
01
g
001
g
01
mVV
(Note 3)
4VsVSs30V
g
002
g
02
g
002
g
02
mVV
Quiescent Current
VSea5V a25 C
5680
5680
m
A
(Note 9)
VSea5V
105
158
91
138
m
A
VSea30V a25 C
562
82
562
82
m
A
VSea30V
1055
161
915
141
m
A
Change of
4VsVSs30V a25 C
02
20
02
20
m
A
Quiescent Current
4VsVSs30V
05
30
05
30
m
A
(Note 3)
Temperature
a
039
a
07
a
039
a
07
m
A C
Coefficient of
Quiescent Current
Minimum Temperature
In circuit of
a
15
a
20
a
15
a
20
C
for Rated Accuracy
Figure 1 ILe0
Long Term Stability
TJeTMAX for
g
008
g
008
C
1000 hours
Note 3
Regulation is measured at constant junction temperature using pulse testing with a low duty cycle Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance
Note 4
Tested Limits are guaranteed and 100% tested in production
Note 5
Design Limits are guaranteed (but not 100% production tested) over the indicated temperature and supply voltage ranges These limits are not used to
calculate outgoing quality levels
Note 6
Specifications in boldface apply over the full rated temperature range
Note 7
Accuracy is defined as the error between the output voltage and 10mv C times the device’s case temperature at specified conditions of voltage current
and temperature (expressed in C)
Note 8
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature
range
Note 9
Quiescent current is defined in the circuit of
Figure 1
Note 10
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when
operating the device beyond its rated operating conditions See Note 1
Note 11
Human body model 100 pF discharged through a 15 kX resistor
Note 12
See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices
3


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