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MIC5233 データシート(PDF) 4 Page - Microchip Technology

部品番号 MIC5233
部品情報  High Input Voltage, Low IQ μCap LDO Regulator
PDF  24 Pages
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メーカー  MICROCHIP [Microchip Technology]
ホームページ  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MIC5233 データシート(HTML) 4 Page - Microchip Technology

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MIC5233
DS20006033E-page 4
 2018-2022 Microchip Technology Inc. and its subsidiaries
Enable Input Current
IEN
–1.0
0.01
1.0
µA
VEN = 0.6V; regulator off
—
0.1
1.0
VEN = 2.0V; regulator on
—
0.5
2.5
VEN = 36V; regulator on
Start-up Time
tSTART
—
1.7
7
ms
VIN applied before EN signal
TEMPERATURE SPECIFICATIONS(1)
Parameters
Sym.
Min.
Typ.
Max.
Units
Conditions
Temperature Ranges
Junction Operating Temperature Range
TJ
-40
—
+125
°C
—
Storage Temperature Range
TS
-65
—
+150
°C
—
Package Thermal Resistances
Thermal Resistance 5-Lead SOT23
JA
—
235
—
°C/W
—
Thermal Resistance 3-Lead SOT223
JA
—
50
—
°C/W
—
Note 1: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air (i.e., TA, TJ, JA). Exceeding the
maximum allowable power dissipation will cause the device operating junction temperature to exceed the
maximum +125°C rating. Sustained junction temperatures above +125°C can impact the device reliability.
2: Design guidance only, not production tested.
TABLE 1-1:
ELECTRICAL CHARACTERISTICS (CONTINUED)
Electrical Characteristics: TJ = +25°C with VIN = VOUT + 1V; IOUT = 100 µA; Bold values indicate -40°C ≤ TJ ≤ +125°C,
unless otherwise specified. Specifications for packaged product only.
Parameter
Symbol
Min.
Typ.
Max.
Units
Conditions
Note 1: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable
junction temperature and the thermal resistance from junction to air (i.e., TA, TJ, JA). Exceeding the
maximum allowable power dissipation will cause the device operating junction temperature to exceed the
maximum +125°C rating. Sustained junction temperatures above +125°C can impact the device reliability.
2: Design guidance only, not production tested.



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