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2SC2879A データシート(PDF) 2 Page - Toshiba Semiconductor |
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2SC2879A データシート(HTML) 2 Page - Toshiba Semiconductor |
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2 / 4 page ![]() 2SC2879A 2007-11-01 2 ELECTRICAL CHARACTERISTICS (Tc = 25°C) CHARACTERISTIC SYMBOL TEST CONDITION MIN. TYP. MAX. UNIT Collector-Emitter Breakdown Voltage V (BR) CEO IC = 100mA, IB = 0 18 — — V Collector-Emitter Breakdown Voltage V (BR) CES IC = 100mA, VEB = 0 45 — — V Emitter-Base Breakdown Voltage V (BR) EBO IE = 1mA, IC = 0 4 — — V DC Current Gain hFE VCE = 5V, IC = 10A 10 — 150 Collector Output Capacitance Cob VCB = 12.5V, IE = 0 f = 1MHz — 700 — pF Power Gain Gp 13.0 15.2 — dB Input Power Pi — 6 10 WPEP Collector Efficiency ηC 35 — — % Intermodulation Distortion IMD VCC = 12.5V, f1 = 28.000MHz f2 = 28.001MHz Iidle = 100mA Po = 100WPEP.(Fig.) — — −24 dB Series Equivalent Input Impedance Zin — 1.45 −j0.95 — Ω Series Equivalent Output Impedance Zout VCC = 12.5V, f = 28MHz Δf = 1kHz, Po = 100WPEP — 1.45 −j1.0 — Ω |
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