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TC9WMB2AFK データシート(PDF) 13 Page - Toshiba Semiconductor |
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TC9WMB2AFK データシート(HTML) 13 Page - Toshiba Semiconductor |
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13 / 18 page ![]() TC9WMB1AFK/FU,TC9WMB2AFK/FU 2007-10-19 13 EEPROM Characteristics (GND = 0 V, 2.3 V ≤ VCC ≤ 2.7 V, Topr = −40 to 85°C) Characteristics Symbol Test Condition Min Typ. Max Unit Write time tWR ⎯ ⎯ ⎯ 12 ms Rewrite endurance NEW ⎯ 1 × 105 ⎯ ⎯ Times Data retention time tRET ⎯ 10 ⎯ ⎯ Years EEPROM Characteristics (GND = 0 V, 2.7 V < VCC ≤ 3.6 V, Topr = −40 to 85°C) Characteristics Symbol Test Condition Min Typ. Max Unit Write time tWR ⎯ ⎯ ⎯ 10 ms Rewrite endurance NEW ⎯ 1 × 105 ⎯ ⎯ Times Data retention time tRET ⎯ 10 ⎯ ⎯ Years Capacitance Characteristics (Ta = 25°C) Characteristics Symbol Test Condition VCC (V) Typ. Unit Input capacitance CIN ⎯ 3.3 4 pF Output capacitance CO ⎯ 3.3 3 pF |
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