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SN54ABT8543 データシート(PDF) 13 Page - Texas Instruments |
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SN54ABT8543 データシート(HTML) 13 Page - Texas Instruments |
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13 / 31 page ![]() SN54ABT8543, SN74ABT8543 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS SCBS120E – AUGUST 1991 – REVISED JULY 1996 13 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 pseudo-random pattern generation (PRPG) A pseudo-random pattern is generated in the shift-register elements of the selected BSCs on each rising edge of TCK, updated in the shadow latches, and applied to the associated device output pins on each falling edge of TCK. This data also is updated in the shadow latches of the selected input BSCs and applied to the inputs of the normal on-chip logic. Figures 4 and 5 show the 16-bit linear-feedback shift-register algorithms through which the patterns are generated. An initial seed value should be scanned into the BSR before performing this operation. A seed value of all zeroes does not produce additional patterns. = A8-I B8-O A7-I A6-I A5-I A4-I A3-I A2-I A1-I B7-O B6-O B5-O B4-O B3-O B2-O B1-O Figure 4. 16-Bit PRPG Configuration (OEA = 0, OEB = 1) = B8-I A8-O B7-I B6-I B5-I B4-I B3-I B2-I B1-I A7-O A6-O A5-O A4-O A3-O A2-O A1-O Figure 5. 16-Bit PRPG Configuration (OEA=1, OEB= 0) |
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