(7)

tRC in Figure 6-19 represents the time required for the pullup circuitry to raise the voltage on the SDQ pin from VIL to the input-high

threshold of the host device. Hence, the actual maximum duration for the host to pull the line low is tRLMAX + tF.

(8)

Refers to the minimum time after which the recognition of negative edge is possible after VTH has been reached on the preceding

rising edge.

(9)

Data retention time is degraded as TA increases. Long-term storage at elevated temperatures is not recommended.

5.7 Functional Tests

Over operating free-air temperature range and VPUP = 3.3V and 5V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Multi-target bus

Any TMF0008 must be able to communicate in a network where

there are multiple responder devices. An example configuration

of 3 responder devices (including the DUT) is shown in Multiple

Responder Configurations. (1)

0

Multi-

responder

Bus Fails

(1)

See Test Procedures for Functional Tests.

5.8 Typical Characteristics

Te mperature(°C)

-10

0

10

20

30

40

50

60

70

80

1E-6

2E-6

3E-6

4E-6

5E-6

6E-6

7E-6

VPUP = 3.3V

VPUP = 5V

Figure 5-1. Input Load Current (IL) vs Temperature

(Standard Speed)

Te mperature (°C)

-10

0

10

20

30

40

50

60

70

80

1E-6

2E-6

3E-6

4E-6

5E-6

6E-6

7E-6

VPUP = 5V

Figure 5-2. Input Load Current (IL) vs Temperature

(Overdrive Speed)

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TMF0008

SLVSIV3 – JULY 2025

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