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AMC3301 データシート(PDF) 9 Page - Texas Instruments |
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AMC3301 データシート(HTML) 9 Page - Texas Instruments |
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9 / 38 page ![]() 5.9 Electrical Characteristics (continued) minimum and maximum specifications apply from TA = –40°C to +125°C, VDD = 3.0 V to 5.5 V, INP = –250 mV to +250 mV, INN = HGND = 0 V, and the external components listed in the Typical Application section; typical specifications are at TA = 25°C, and VDD = 3.3 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT DIGITAL OUTPUT (DIAG) VOL Low-level output voltage ISINK= 4 mA 80 250 mV ILKG Open-drain output leakage current VDD = 5V 5 100 nA POWER SUPPLY IDD Low-side supply current no external load on HLDO 27.5 40 mA 1 mA external load on HLDO 29.5 42 VDDUV VDD analog undervoltage detection threshold VDD rising 2.9 V VDD falling 2.8 VDDPOR VDD digital reset threshold VDD rising 2.5 V VDD falling 2.4 VDCDC_OUT DCDC output voltage DCDC_OUT to HGND 3.1 3.5 4.65 V VDCDCUV DCDC output undervoltage detection threshold voltage DCDC output falling 2.1 2.25 V VHLDO_OUT High-side LDO output voltage HLDO to HGND, 4 mA external load, VDD > 3.6 V 3 3.2 3.4 V VHLDOUV High-side LDO output undervoltage detection threshold voltage HLDO output falling 2.4 2.6 V IH High-side supply current for auxiliary circuitry 3 V ≤ VDD < 3.6 V, load connected from HLDO_OUT to HGND, non- switching 1 mA 3.6 V ≤ VDD ≤ 5.5 V, load connected from HLDO_OUT to HGND, non- switching 4.0 mA tAS Analog settling time VDD step to 3.0 V, to OUTP and OUTN valid, 0.1% settling 0.9 1.4 ms (1) The typical value includes one standard deviation ("sigma") at nominal operating conditions. (2) This parameter is input referred. (3) THD is the ratio of the rms sum of the amplitues of first five higher harmonics to the amplitude of the fundamental. (4) Offset error temperature drift is calculated using the box method, as described by the following equation: TCVOS = (VOS,MAX - VOS,MIN) / TempRange where VOS,MAX and VOS,MIN refer to the maximum and minimum VOS values measured within the temperature range (–40 to 125 ℃). (5) Gain error temperature drift is calculated using the box method, as described by the following equation: TCEG (ppm) = ((EG,MAX - EG,MIN) / TempRange) x 104 where EG,MAX and EG,MIN refer to the maximum and minimum EG values (in %) measured within the temperature range (–40 to 125 ℃). www.ti.com AMC3301 SBAS917C – AUGUST 2019 – REVISED MAY 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 9 Product Folder Links: AMC3301 |
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