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L9826 データシート(PDF) 14 Page - STMicroelectronics |
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L9826 データシート(HTML) 14 Page - STMicroelectronics |
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14 / 19 page ![]() Functional description L9826 14/19 Doc ID 7214 Rev 10 5.3 Output stage diagnostics All the outputs voltage are compared with the diagnostic threshold (0.38 Typ · VCC) and this information is transferred in dedicated fault latches which are cleared when the NCS reaches the state low. Afterward the latch stores the status bit and the first reading after the error might be wrong. The second one is considered right. The next Figure 7 and 8 show the diagnostic bits read out on SDO and their organization into the dedicated registers. When NCS is low the data contained in the shift register are transferred to SDO output every CLK rising edge. Figure 7. The pulse diagram to read the outputs status register Figure 8. The structure of the outputs status register |
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