HCF4536B datasheet(12/17 Pages) STMICROELECTRONICS

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Functional Test Sequence

Inputs

Outputs

Comments

I n1

Set

Reset

8-Bypass

Decade Out

Q 1 Thru Q 2 4

All 2 4 steps a r e in reset mode.

101

111

Counter is in three 8-stage section in parallel

mode.

First ”1” to ”0” Transition of Clock

–

255 ”1” to ”0” transitions are clocked in the

counter.

The 255 ”1” to ”0” Transition

000

Counter converted back to 24 stages in series

mode.

Set and Reset must be connected together and

simultaneoulsy go from ”1” to ”0”.

100

In 1 switches to a ”1”.

Counter Ripples from an all ”1” state to an all ”0”

state.

Input Voltage.

Quiescent Device Current.

TEST CIRCUITS

FUNCTIONAL TEST SEQUENCE

Test Function has been included for the reduction of

test time required to exercise all 24 counter stages.

This test function divides the counter into three 8-

stage section and 255 counts are loaded in each of

the 8-stage sections in parallel. All flip-flops are now

at a ”1”. The counter is now returned to the normal

24-steps in series configuration. One more pulse is

entered into In1 which will cause the counter to ripple

from an all ”1” state to an all ”0” state.

HCC/HCF4536B

12/17

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