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STM32F101X8 データシート(PDF) 69 Page - STMicroelectronics

部品番号 STM32F101X8
部品情報  Medium-density access line, ARM®-based 32-bit MCU with 64 or 128 KB Flash, 6 timers, ADC and 7 communication interfaces
PDF  101 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F101X8 データシート(HTML) 69 Page - STMicroelectronics

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DocID13586 Rev 17
69/101
STM32F101x8, STM32F101xB
Electrical characteristics
100
Equation 1: RAIN max formula:
The formula above (Equation 1) is used to determine the maximum external impedance allowed for an
error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 42. RAIN max for fADC = 14 MHz(1)
1. Guaranteed by design, not tested in production.
Ts (cycles)
tS (µs)
RAIN max (k)
1.5
0.11
0.4
7.5
0.54
5.9
13.5
0.96
11.4
28.5
2.04
25.2
41.5
2.96
37.2
55.5
3.96
50
71.5
5.11
NA
239.5
17.1
NA
Table 43. ADC accuracy - limited test conditions(1) (2)
1. ADC DC accuracy values are measured after internal calibration.
2. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any analog input pins should
be avoided as this significantly reduces the accuracy of the conversion being performed on another analog
input. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially
inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in Section 5.3.12 does not
affect the ADC accuracy.
Symbol
Parameter
Test conditions
Typ
Max(3)
3. Based on characterization, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 28 MHz,
fADC = 14 MHz, RAIN < 10 k,
VDDA = 3 V to 3.6 V
TA = 25 °C
Measurements made after
ADC calibration
±1.3
±2
LSB
EO
Offset error
±1
±1.5
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±0.7
±1
EL
Integral linearity error
±0.8
±1.5
RAIN
TS
fADC CADC
2
N2
+

ln
-------------------------------------------------------------- RADC
–



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