EVALUATION DEVICE

An evaluation device is used to demonstrate the

performance of the ISB35000 series as well as

verify the effectiveness of the design system. The

device has path delays, latches, a host of macro-

cells and embedded functions which were used to

verify the simulated characteristics that are supplied

in the data book. Characterization of the path delays

including interconnect shows typical delays of 210

ps for a 2 input NAND with receivers/drivers oper-

ating at frequencies of 200 MHz. The evaluation

device is available in a 208 pin plastic quad flat pack.

Figure 5. Evaluation Device

ISB35000 SERIES

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