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APM32E103CCT6-R データシート(PDF) 41 Page - Geehy Semiconductor Co., Ltd.

部品番号 APM32E103CCT6-R
部品情報  Arm® Cortex®-M3 based 32-bit MCU
PDF  79 Pages
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メーカー  GEEHY [Geehy Semiconductor Co., Ltd.]
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APM32E103CCT6-R データシート(HTML) 41 Page - Geehy Semiconductor Co., Ltd.

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Pag e 40
Symbol
Parameter
Conditions
Minimum
value
Typical
value
Maximum
value
Unit
voltage level
selection
PLS[2:0]=001 (falling edge)
2.16
-
2.19
V
PLS[2:0]=001(PVD hysteresis)
110
-
120
mV
PLS[2:0]=010 (rising edgeg)
2.37
-
2.40
V
PLS[2:0]=010 (falling edge)
2.26
-
2.29
V
PLS[2:0]=010(PVD hysteresis)
100
-
110
mV
PLS[2:0]=011 (rising edgeg)
2.46
-
2.50
V
PLS[2:0]=011 (falling edge)
2.36
-
2.39
V
PLS[2:0]=011(PVD hysteresis)
100
-
110
mV
PLS[2:0]=100 (rising edgeg)
2.57
-
2.60
V
PLS[2:0]=100 (falling edge)
2.45
-
2.49
V
PLS[2:0]=100(PVD hysteresis)
110
-
120
mV
PLS[2:0]=101 (rising edgeg)
2.66
-
2.70
V
PLS[2:0]=101 (falling edge)
2.56
-
2.59
V
PLS[2:0]=101(PVD hysteresis)
100
-
110
mV
PLS[2:0]=110 (rising edgeg)
2.76
-
2.80
V
PLS[2:0]=110 (falling edge)
2.65
-
2.69
V
PLS[2:0]=110(PVD hysteresis)
110
-
110
mV
PLS[2:0]=111 (rising edgeg)
2.87
-
2.91
V
PLS[2:0]=111 (falling edge)
2.75
-
2.79
V
PLS[2:0]=111(PVD hysteresis)
110
-
120
mV
Note: It is obtained from a comprehensive evaluation and is not tested in production.
5.7.
Power consumption
Forms containing SDRAM are applicable to APM32E103xCxETxS, otherwise applicable to
APM32E103xCxETx.
5.7.1.
Power consumption test environment
(1) The values are measured by executing Dhrystone 2.1, with the Keil.V5 compilation
environment and the L0 compilation optimization level.
(2) All I/O pins are in input mode with a static value at VDD or VSS (no load)
(3) Unless otherwise specified, all peripherals are turned off
(4) The relationship between Flash waiting cycle setting and fHCLK :
0~24MHz: 0 waiting cycle
24~48MHz: 1 waiting cycle
48~72MHz: 2 waiting cycles



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