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ST70135 データシート(PDF) 2 Page - STMicroelectronics |
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ST70135 データシート(HTML) 2 Page - STMicroelectronics |
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2 / 29 page  ST70135A 2/29 Figure 1 : Block Diagram TRANSIENT ENERGY CAPABILITIES ESD ESD (Electronic Discharged) tests have been performed for the Human Body Model (HBM) and for the Charged Device Model (CDM). The pins of the device are to be able to withstand minimum 2000V for the HBM and minimum 250V for CDM. Latch-up The maximum sink or source current from any pin is limited to 200mA to prevent latch-up. ABSOLUTE MAXIMUM RATINGS TEST MODULE DATA SYMBOL TIMING UNIT VCXO DSP FRONT-END FFT/IFFT ROTOR TRELLIS CODING GENERIC TC INTERFACE MODULE AFE CONTROL CONTROLLER ATM TEST SIGNALS CLOCK AFE INTERFACE AFE CONTROL CONTROLLER BUS GENERAL PURPOSE I/Os STM UTOPIA MAPPER/ DEMAPPER REED/ SOLOMON INTERFACE SPECIFIC TC INTERFACE Symbol Parameter Minimum Typical Maximum Unit VDD Supply Voltage 3.0 3.3 3.6 V Ptot Total Power Dissipation 900 1400 mW Tamb Ambient Temperature 1m/s airflow 0 70 °C |
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