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STM7E1AR データシート(PDF) 5 Page - STMicroelectronics |
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STM7E1AR データシート(HTML) 5 Page - STMicroelectronics |
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5 / 16 page ![]() STM7E1 Application circuit 5/16 1.1 Test mode description (mode = 0, test = 1) In order to test the main switches (4-point measurement), test modes are foreseen where the main switches can be controlled independently from each other. One can enter in test mode by controlling the Sc, Lm and Ls pins according to the following table. The digital part and auxiliary switches can be tested in functional mode Note: Although there is an internal pull down in the TEST pin, an external hardware connection from TEST to GND is required on the board to work in functional, mode. Table 5. Test mode Signification Sc Lm Ls A_TX closed H H L A_RX closed L H L B_TX closed H L H B_RX closed L L H B_TX & c closed H L L A_RX & d closed L L L All main switches open HH H LH H |
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