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SN54ALS112AFK データシート(PDF) 2 Page - Texas Instruments

部品番号 SN54ALS112AFK
部品情報  DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET
PDF  6 Pages
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メーカー  TI [Texas Instruments]
ホームページ  http://www.ti.com
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SN54ALS112AFK データシート(HTML) 2 Page - Texas Instruments

  SN54ALS112AFK Datasheet HTML 1Page - Texas Instruments SN54ALS112AFK Datasheet HTML 2Page - Texas Instruments SN54ALS112AFK Datasheet HTML 3Page - Texas Instruments SN54ALS112AFK Datasheet HTML 4Page - Texas Instruments SN54ALS112AFK Datasheet HTML 5Page - Texas Instruments SN54ALS112AFK Datasheet HTML 6Page - Texas Instruments  
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SN54ALS112A, SN74ALS112A
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS
WITH CLEAR AND PRESET
SDAS199A – APRIL 1982 – REVISED DECEMBER 1994
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic symbol
S
4
1J
3
1J
1K
2
1K
R
15
1Q
5
6
C1
1PRE
1CLR
1Q
1
1CLK
10
11
2J
12
2K
14
2Q
9
7
2PRE
2CLR
2Q
13
2CLK
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
logic diagram (positive logic)
PRE
CLK
K
Q
Q
CLR
J
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, VCC
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage, VI
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: SN54ALS112A
– 55
°C to 125°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ALS112A
0
°C to 70°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
– 65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.



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