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SPT5510 データシート(PDF) 7 Page - Cadeka Microcircuits LLC. |
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SPT5510 データシート(HTML) 7 Page - Cadeka Microcircuits LLC. |
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7 / 8 page ![]() 7 9/27/00 SPT5510 LONG-TERM STABILITY VERSUS TEMPERATURE As with all high-speed, high-resolution digital-to-analog con- verters, the initial accuracy of the device will degrade with both time and temperature. The graph shown in figure 7 can be used to determine the expected change in linearity per- formance over time when the device is operated at various ambient temperatures. This graph shows how long it will take for the SPT5510 linearity to change by 8 ppm (or 1/2 LSB) at any operating temperature. The top curve shown represents integral nonlinearity (ILE) changes; the bottom curve shows differential nonlinearity (DLE) changes. Figure 7 – Linearity Performance over Time Temperature ( °C) Expected time required to produce an 8 ppm (1/2 LSB) linearity (ILE or DLE) shift as a function of temperature. 0 20 40 60 80 100 120 1 month 1 year 100 years 1000 years ILE DLE around 300 MHz, the amplifier’s phase crossover point. The unity-gain bandwidth is roughly 700 MHz. Larger value capacitors exhibit lower self-resonance frequency and thus may not adequately compensate the reference amplifier. Large capacitors may also introduce low frequency tails which increase settling time. The DAC itself exhibits very broadband switching spikes (charge kickback) at the RSET node, which can contribute to amplifier instability if not sup- pressed. Note that the AMPINB input must not be directly bypassed, as this will short all feedback to ground, leading to severe oscillation. Compensation must be optimized for each application. As with any high-speed, high-resolution design, attention must be paid to grounding, decoupling, and parasitic elements that may cause instability. It may be wise to use a guard ring, and/or clear the board ground, around the reference amplifier’s inputs. All traces must be short, and capacitors with high self-resonance must be used. Compensation is perhaps the most challenging aspect of setting up the SPT5510. By slowly switching a full-scale data input (generating a low-frequency square wave), with appropriate clock timing, the DAC’s output can be observed using a suitable oscilloscope and spectrum analyzer to observe and suppress any oscillations caused by board and ther assistance if required. PACKAGE OUTLINE 44-Lead MQFP Index A B C D Pin 1 E F G H I J K INCHES MILLIMETERS SYMBOL MIN MAX MIN MAX A 0.5098 0.5295 12.95 13.45 B 0.3917 0.3957 9.95 10.05 C 0.3917 0.3957 9.95 10.05 D 0.5098 0.5295 12.95 13.45 E 0.0311 0.0319 0.79 0.81 F 0.0118 0.0177 0.30 0.45 G 0.0768 0.0827 1.95 2.10 H 0.0039 0.0098 0.10 0.25 I 0.0287 0.0406 0.73 1.03 J 0.0630 REF 1.60 REF K0 ° 7 ° 0 ° 7 ° decoupling parasitics. Consult CADEKA Applications for fur- |
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