10

Specifications for opto-electrical measurements at 1310 nm

N4374B system with network analyzer

E5071C -245

Specifications are valid under the stated measurement conditions.

For wavelength:

(1310 ±20) nm

(option -100, 102)

System performance

10 MHz to 50 GHz

50 MHz to 0.7 GHz

0.7 GHz to 4.5 GHz

Relative frequency

response

DUT response

±0.5 dBe typ.

±0.7 dBe

±0.8 dBe

≥ -46 dB(A/W)

±0.5 dBe typ.

±0.5 dBe typ.

±0.6 dBe typ.

Absolute frequency

response uncertainty

DUT response

±1.2 dBe typ

±1.8 dBe

±1.8 dBe

Frequency response

DUT response

±0.02 dBe

±0.03 dBe

Minimum measurable frequency

-83 dB(A/W) typ.

-92 dB(A/W)

-92 dB(A/W)

Phase uncertainty

DUT response

-

±1.0°

±1.0°

Group delay uncertainty

Derived from phase uncertainty, see section

“Group delay uncertainty”.

Example: ±1.0° → ±8 ps (0.5 GHz aperture)

[f1]

For DUT response max. +10 dB (A/W).

[f2]

For +4 dBm average output power from LCA optical output

[f3]

IFBW = 100 Hz.

[f4]

Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of ≤0.2 GHz to avoid phase wraps). Excluding a

constant group delay offset of <±0.3 ns typ. (cable length uncertainty <±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod.(in deg).

[f5]

Average value over frequency range.

[f6]

After CW responsivity and user calibration with external source.

[f7]

Requires option -100 or -102.

[f8]

Typical with internal source.

(O/E mode)