Production Data

WM2613

WOLFSON MICROELECTRONICS LTD

Production Data Rev 1.0 June 1999

3

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or

beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to

damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this

device.

CONDITION

MIN

MAX

Supply voltages, AVDD or DVDD to GND

7V

Supply voltage differences, AVDD to DVDD

-2.8V

2.8V

Reference input voltage

-0.3V

DVDD + 0.3V

Digital input voltage range to GND

-0.3V

AVDD + 0.3V

WM2613C

WM2613I

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

AVDD, DVDD

2.7

5.5

V

High-level digital input voltage

DVDD = 2.7V to 5.5V

2

V

Low-level digital input voltage

DVDD = 2.7V to 5.5V

0.8

V

Reference voltage to REFIN

See Note

AVDD - 1.5

V

Load resistance

2

k

Ω

Load capacitance

100

pF

WM2613CDT

0

70

°C

Operating free-air temperature

WM2613IDT

-40

85

°C

Note: Reference voltages greater than AVDD/2 will cause saturation for large DAC codes.