| データシートサーチシステム |
|
STK22C48 データシート(PDF) 9 Page - Cypress Semiconductor |
|
|
|||||||||||||||||||||||||||||
STK22C48 データシート(HTML) 9 Page - Cypress Semiconductor |
|
9 / 17 page ![]() STK22C48 Document Number: 001-51000 Rev. *D Page 9 of 17 AC Switching Characteristics SRAM Read Cycle Parameter Description 25 ns 45 ns Unit Min Max Min Max Cypress Parameter Alt tACE tELQV Chip enable access time – 25 – 45 ns tRC [6] tAVAV, tELEH Read cycle time 25 – 45 – ns tAA [7] tAVQV Address access time – 25 – 45 ns tDOE tGLQV Output enable to data valid – 10 – 20 ns tOHA [7] tAXQX Output hold after address change 5 – 5 – ns tLZCE [8] tELQX Chip enable to output active 5 – 5 – ns tHZCE [8] tEHQZ Chip disable to output inactive – 10 – 15 ns tLZOE [8] tGLQX Output enable to output active 0 – 0 – ns tHZOE [8] tGHQZ Output disable to output inactive – 10 – 15 ns tPU [9] tELICCH Chip enable to power active 0 – 0 – ns tPD [9] tEHICCL Chip disable to power standby – 25 – 45 ns Switching Waveforms Figure 7. SRAM Read Cycle 1: Address Controlled [6, 7] Figure 8. SRAM Read Cycle 2: CE and OE Controlled [6] Notes 6. WE and HSB must be High during SRAM Read cycles. 7. Device is continuously selected with CE and OE both Low. 8. Measured ±200 mV from steady state output voltage. 9. These parameters are guaranteed by design and are not tested. [+] Feedback |
|
|
リンク URL |
| ALLDATASHEETはお客様のビジネスに役立ちますか? [ DONATE ] |
Alldatasheetは | 広告 | お問い合わせ | プライバシーポリシー | データシートへのリンク | リンク交換 | メーカーリスト All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |