Prelim. 1/99

IP117MAHV-LCC4

IP117MHV-LCC4

IP117MA-LCC4

1) Regulation is measured at constant junction temperature, using pulse testing at a low duty cycle. Changes in output voltage due to

heating effects are covered under thermal regulation specifications.

2) Test Conditions unless othewise stated:

1.238

1.25

1.262

1.220

1.250

1.270

0.005

0.010

0.010

0.020

515

0.1

0.3

15

50

0.3

1

0.002

0.020

65

66

80

50

100

0.2

5

3.5

5

3.5

7

0.50

0.80

0.15

0.20

0.30

12

0.3

1

0.001

13

1.200

1.250

1.300

0.010

0.020

0.020

0.050

515

0.1

0.3

20

50

0.3

1

0.030

0.070

65

66

80

50

100

0.2

5

3.5

5

3.5

7

0.50

0.80

0.15

0.20

0.30

1

0.3

1

0.001

13

IP117MAHV

IP117MHV , IP117M

IP117MA

Parameter

Test Conditions

Min.

Typ.

Max.

Min.

Typ.

Max.

Units

Reference Voltage

∆V

OUT

∆V

IN

∆V

OUT

∆I

OUT

Thermal Regulation

Ripple Rejection

Adjust Pin Current

∆I

ADJ

Adjust Pin Current

Change

Minimum Load

Current

Current Limit

∆V

∆TEMP Stability

∆V

OUT

Long Term Stability

∆TIME

RMS Output Noise

Thermal Resistance

Junction to Case

P

≤ P

MAX

f = 120Hz

t = 1000 Hrs

f = 10 Hz to 10 kHz

LCC4 Package

V

V

% / V

mV

%

mV

%

%/W

dB

dB

µA

µA

mA

A

A

%

%

%

°C/W