74LVC2G08

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Product data sheet

Rev. 9 — 20 October 2010

9 of 21

NXP Semiconductors

74LVC2G08

Dual 2-input AND gate

Test data is given in Table 10.

Definitions for test circuit:

Fig 9.

Test circuit for measuring switching times

001aae235

DUT

CL

RT

RL

RL

PULSE

GENERATOR

10 %

90 %

0 V

negative

pulse

positive

pulse

0 V

90 %

10 %

Table 10.

Test data

Supply voltage

Input

Load

1.65 V to 1.95 V

≤ 2.0 ns

30 pF

1 k

Ω

open

2.3 V to 2.7 V

≤ 2.0 ns

30 pF

500

Ω

open

2.7 V

2.7 V

≤ 2.5 ns

50 pF

500

Ω

open

3.0 V to 3.6 V

2.7 V

≤ 2.5 ns

50 pF

500

Ω

open

4.5 V to 5.5 V

≤ 2.5 ns

50 pF

500

Ω

open