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TMS570LS3137 データシート(PDF) 115 Page - Texas Instruments |
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TMS570LS3137 データシート(HTML) 115 Page - Texas Instruments |
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115 / 159 page ![]() TRST TMS TCK TDI TDO RTCK Boundary BSDL Boundary Scan Interface Scan Device Pins (conceptual) TDI TDO TMS570LS3137 www.ti.com SPNS162. – SEPTEMBER 2011 4.21.10 Boundary Scan Chain The device supports BSDL-compliant boundary scan for testing pin-to-pin compatibility. The boundary scan chain is connected to the Boundary Scan Interface of the ICEPICK module. Figure 4-30. Boundary Scan Implementation (Conceptual Diagram) Data is serially shifted into all boundary-scan buffers via TDI, and out via TDO. Copyright © 2011, Texas Instruments Incorporated System Information and Electrical Specifications 115 Submit Documentation Feedback focus.ti.com: TMS570LS3137 |
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