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CUS520 データシート(PDF) 1 Page - Toshiba Semiconductor |
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CUS520 データシート(HTML) 1 Page - Toshiba Semiconductor |
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1 / 5 page ![]() CUS520 1 Schottky Barrier Diode Silicon Epitaxial CUS520 CUS520 CUS520 CUS520 1. 1. 1. 1. Applications Applications Applications Applications • High-Speed Switching 2. 2. 2. 2. Features Features Features Features (1) Low reverse current: IR(2) = 5 µA (max) (2) General-purpose USC package, equivalent to SOD-323 and SC-76 packages. 3. 3. 3. 3. Packaging and Internal Circuit Packaging and Internal Circuit Packaging and Internal Circuit Packaging and Internal Circuit USC 1: Cathode 2: Anode 4. 4. 4. 4. Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Reverse voltage Peak forward current Average rectified current Non-repetitive peak forward surge current Power dissipation Junction temperature Storage temperature Operating temperature Symbol VR IFM IO IFSM PD Tj Tstg Topr Note (Note 1) (Note 2) Rating 30 300 200 1 150 125 -55 to 125 -40 to 100 Unit V mA A mW Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Measured with a 10 ms pulse. Note 2: Mounted on a glass epoxy circuit board of 20 mm × 20 mm, Pad dimension of 4 mm × 4 mm. 2012-06-12 Rev.4.0 |
同様の部品番号 - CUS520 |
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同様の説明 - CUS520 |
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