bq76PL536APAP datasheet(52/60 Pages) TI

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bq76PL536A

SLUSAD3A – JUNE 2011 – REVISED AUGUST 2012

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Changes and Enhancements for bq76PL536A

•

Improved power management during CRC faults – Configuration bit IO_CONFIG[CRCNOFLT] (bit7) was

added to disable CRC fault from asserting the FAULT pin. This feature is useful under very low-power

operating conditions.

•

ADC accuracy improvements – The conversion timing is now fixed at 6 µs, offering improved accuracy over

the original bq76PL536.

•

Improved ADC automatic mode functionality, allowing optimized and fully automatic internal power

management (ADC_CTRL[ADC_ON] = 0) during normal operation at sample rates (time between

conversions) > 10 ms.

•

Pin DRDY logic now indicates conversion status of all devices in the system.

•

Improved VBUS communications reduce noise, enhance drive levels and hysteresis to improve battery stack

communications, and eliminate eight external components or more. Support for longer distances between ICs

and/or higher speeds for implementing large battery stack sizes.

•

Improved flowchart for device addressing provided in data sheet.

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REVISION HISTORY

Changes from Revision Original (June 2011) to Revision A

Page

•

Changed the pinout image to remove the device number and package type ...................................................................... 4

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bq76PL536APAP データシート(PDF) 52 Page - Texas Instruments