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ABSOLUTE MAXIMUM RATINGS

RECOMMENDED OPERATING CONDITIONS

PCM2912

SLES216 – FEBRUARY 2008

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

over operating free-air temperature range (unless otherwise noted)

(1) (2)

PCM2912

UNIT

Supply voltage

–0.3 to +6.5

V

Ground voltage differences: BGND, PGND, AGND, HGND, DGND

±0.1

V

–0.3 to 4

V

PLAY, REC.

–0.3 to 6.5

V

Digital input voltage

D+, D–, XTI, XTO, MMUTE, TEST0, TEST1, POWER, MAMP, SSPND

–0.3 to 4

V

Analog input voltage

–0.3 to 4

V

Input current (any pins except supplies)

±10

mA

Ambient temperature under bias

–40 to 125

°C

Storage temperature

–55 to 150

°C

Junction temperature

150

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.

(2)

All voltage values are with respect to network ground terminal.

over operating free-air temperature range (unless otherwise noted)

MIN

NOM

MAX

UNIT

Supply voltage

4.35

5.00

5.25

V

Analog input voltage, full scale (–0 dB)

Vp-p

Digital input logic family

TTL

Digital iInput clock frequency

5.997

6.000

6.003

MHz

Analog output load resistance

32

Ω

Analog output load capacitance

100

pF

Digital output load capacitance

10

pF

Operating free-air temperature

–25

70

°C

2

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Product Folder Link(s): PCM2912